TIDeX is a dedicated Total Ionizing Dose (TID) effect testing system developed to support the evaluation and qualification of electronic components exposed to radiation-rich environments. Designed for semiconductor radiation testing, radiation hardness testing, and electronic component radiation testing, it provides researchers and engineers with a streamlined platform for assessing device performance under controlled radiation conditions.
From radiation testing of space and aerospace electronics to defence and commercial electronics development and qulaity control, TIDeX enables efficient component validation in radiation environments without the challenges associated with traditional radioactive sources. With integrated dosimetry, wafer handling capabilities, and support for radiation qualification testing for components, it provides a modern approach to radiation effects testing and component longevity.